Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

Code testing with modern static analysis provides a solution that not only allows developers to identify and fix concurrency defects in new code, it also provides a cost-effective and automated way to ...

SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...

An international research group has found that the presence of a few lattice defects in a kesterite PV cell material can actually improve efficiency, rather than lowering it. The group believes that ...